Washington D.C. Chapter: Treatments and Synthetics with John Koivula

Millions of carats of synthetics have been produced and sold into the gem industry since the introduction of so-called “Geneva rubies” in the 1880s. Since then, countless numbers of treated stones have also become available.

This influx of synthetic and treated materials means it never hurts to re-examine the main identifying characteristics that distinguish natural gems from treated stones and synthetics. The gemological microscope is often the best tool you can use to do so because it offers a completely non-destructive means of analysis. Inclusions and other micro-features in gem material provide many of the major clues you need to identify them and the materials used to imitate them.

John Koivula, an analytical microscopist, joined GIA in 1976 and has spent more than 50 years studying and photographing the micro-world of gemstones. He has published more than 800 articles and notes on inclusions in gemstones and related topics. He holds university degrees in geology and chemistry, and is a GIA GG, a Certified Gemologist from AGS and a Fellow of the Gemmological Association of Great Britain. He was awarded Fellowship in the Royal Microscopical Society and also serves on the executive board of the International Gemmological Conference group (IGC).

All are welcome to attend; whether you're a GIA graduate, student, industry associate, hobbyist or guest. Please share this invitation with any others you feel would be interested.