Hong Kong Jewellery & Watch Fair participants can cap off a week of show activities by attending an important diamond cut presentation given by GIA laboratory officials.

On Aug. 1, 2005, GIA formally announced the beginning of the implementation period of the Institute's new Diamond Cut Grading System. To support the transition to the new system, GIA’s GemFest Asia, to be held Friday, Sept. 23, from 8:30 a.m. to 12 p.m., will include a comprehensive review of “The GIA Diamond Cut Grading System.” The program will be held in Room 201B of the Hong Kong Convention and Exhibition Centre. A continental breakfast sponsored by the GIA Alumni Association will be served.

Tom Moses, the GIA Laboratory’s vice president of Identification and Research Services, Barak Green, GIA Laboratory communications manager, and Phil Yantzer, West Coast Grading Laboratory director, will present information on GIA’s new grading reports, cut software, and other support products. Further details concerning the implementation of the new system, including the reissue of reports to receive the new cut grade, will also be provided.

“We want to keep the international gem and jewelry community informed about the new GIA Diamond Cut Grading System, and how cut grade information will appear on our laboratory reports,” Moses said. “Our presentation in Hong Kong is part of our ongoing efforts to explain how the system was formed, how it will work, and how it will affect the trade.”

GIA alumni who attend GemFest Asia will receive six Carat Points. Space is limited and seats will be filled on a first-come, first-served basis. Please RSVP by Sept. 13 by e-mailing   events@gia.edu or giahk@netvigator.com. You can also call the Carlsbad headquarters at 760-603-4205 or GIA Hong Kong at +852-2303-0075.

June 4, 2005