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Fall 2006, Volume 42, Issue 3


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Gem Characterization Techniques


Applications of LA-ICP-MS (Laser Ablation–Inductively Coupled Plasma–Mass Spectrometry) to the Gemological Field
Ahmadjan Abduriyim and Hiroshi Kitawaki

High-Energy Ultraviolet Luminescence Imaging: Applications of the DTC DiamondView for Gem Identification
Christopher M. Breeding, Wuyi Wang, Andy H. Shen, Shane F. McClure, James E. Shigley, and Dino DeGhionno

Imaging Spectroscopy: A Developing Frontier for Gem Analysis
Nicholas Del Re

The Present and Future Potential of Raman Spectroscopy in the Characterization of Gems and Minerals
M. Bonner Denton and Robert T. Downs

Report on the Progress of the RRUFF Project: An Integrated Database of Raman Spectra, X-ray Diffraction, and Chemical Data for Minerals
Robert T. Downs and M. Bonner Denton

Gem Characterization: A Forecast of Important Techniques in the Coming Decade
Emmanuel Fritsch

Autoradiographic Investigations of Impurity Distributions in Diamond
Delara S. Khamrayeva and Yulia P. Solodova

Automating the Infrared and Raman Spectral Analysis of Gemstones
Steve Lowry and Jerry Workman

X-ray Diffraction Using Area Detectors for Mineral and Gem Characterization
Jeffrey E. Post

Characterization of Nanofeatures in Gem Materials
George R. Rossman

Infrared Spectra of Gem Corundum
Christopher P. Smith and Carolyn van der Bogert

Investigation by Synchrotron X-ray Diffraction Topography of the Crystal Structure Defects in Colored Diamonds (Natural, Synthetic, and Treated)
Joe C.C. Yuan, Ming-sheng Peng, and Yu-fei Meng

 

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