More than 280 members of the gem and jewelry industry attended GemFest Asia – Hong Kong, where representatives from the GIA’s Laboratory presented a review of the Institute’s Diamond Cut Grading System for round brilliants.

Thomas M. Moses, senior vice president, GIA Laboratory and Research, Phil Yantzer, director of West Coast Grading Laboratory, and Barak Green, manager of Laboratory Communications, outlined the grading system’s structure and provided additional information on the system’s tools designed to help members of the industry estimate cut grades.

The event was preceded by a breakfast that was hosted by the GIA Alumni Association.

Phil Yantzer explains GIA's Cut Grading System for round brilliants.

Barak Green addresses the tools designed to
help manufacturers estimate cut grades.